Weizetech was founded in May 2015, the exclusive distributor of Micro Lithography Inc. (MLI) in China, and we have always been an important supplier of consumables and equipment for domestic semiconductor manufacturers.
We focus on the development of photomasks,photolithography, etching, thin film deposition and metallization, griding, measurement and testing of Chinese semiconductors, and provide corresponding equipment, materials and services.
l Photomask field:
Pellicle, Pellicle Holder, pellicle mounting machine, pellicle demounting machine, pellicle removal crowbar, laser repair machine; Mask boxes, Mask picks, RSP SMIF opener, POD cabinet.
l Photolithography field:
Cassette, FOUP series, SMIF POD-Wafer & Mask, Shipping Boxes, Stock-FOUP & Mask, Auto Wafer Transfer, Wafer Clamps, Pens, SMIF Pods, Reticle Holders, RSP SMIF Openers.
ELS's single-wafer Spin Stripper, Mask Aligner, Scrubber, Mask Cleaner, EBR, Coater, Developer, Hot Plate.
Onto Innovation Inc., a NASDAQ-listed company that merged with Rudolph and Nanometrics) to package Stepper JetStep.
l Etching field:
ELS's single-wafer wet etcher machine.
l Thin film deposition and metallization:
FSE's Vacuum Electron Beam/Thermal Resistance Evaporation System, Vacuum Continuous Sputtering System, Automatic Optical Coating System, Plasma Cleaning System.
l Grinding field:
XinZhan's 4/5/6/8/12 inch automatic wafer grinder machine.
l Measurement and testing field:
Onto Innovation Inc. (a NASDAQ-listed company merged with Rudolph and Nanometrics)’s Advanced Metal Metrology with PULSE Technology System Echo, Advanced OCD & Thin Film Metrology System Atlas/IRIS S/NanoSpec, Optical Overlay & CD Metrology System IVS220, 2D/3D Advanced Wafer Inspection & Metrology System Dragonfly G3/NSX330, FTIR Metrology Element S & QS1200.
KLA Filmetrics' Thickness Measurement Mapping Instrument F50, Stylus Profilometer 2D/3D Stylus Measurement Alpha Step D500/D600, 4PP Sheet Resistance Mapping System R50, Nano Indenter G200X.
Gacii's 4/6/8 inch critical size scanning electron microscope CD-SEM.
AK OPTICS' substrate and epitaxial defect detection equipment: E3500 SiC defect detection equipment, E1000 sapphire, GaAs/GaN/InP/LN/LT and other substrate and epitaxial wafer defect detection equipment, E3200 GaN substrate/Si/PSS/Sapphire/SiC-based GaN epitaxial defect detection equipment, SPI300 crystal circle appearance sorting equipment.
Japan Kano Instruments (KANOMAX) scanning type liquid nanoparticle counter (STPC3), liquid nanoparticle distribution online analyzer (LNS), nanoparticle efficient sampling system (NPE/NPC), nanoparticle atomizer, precision dilution system, high-resolution time-of-flight mass spectrometer (infiTOF/UHV).
LUMINA'S AT1/AT2 Defect Scanner.
HORIBA's Ellipsometer UVISEL Plus, Glow Discharge Optical Emission Spectrometer GD-Profiler 2, Raman spectrometer, particle size meter.
With the core values of "customer first, excellent quality, and professional service", WeiZe has served the semiconductor IC industry for more than 10 years and won the recognition and praise of customers. We will continue to forge ahead and strive to provide customers with high-quality products and more professional services.