Semiconductor
Photomasks Field
Photolithography Field
Etching field
Thin Film Deposition & Metallization Field
Grinding Field
Measurement & Testing Field
Advanced Wafer Inspection & Metrology System_Dragonfly G3
Advanced Wafer Inspection & Metrology System_NSX330
Optical Overlay & CD Metrology System_IVS220
Advanced OCD & Thin Film Metrology System_Atlas
Advanced OCD & Thin Film Metrology System_IRIS S
Advanced Metal Metrology with PULSE Technology System_Echo
FTIR Metrology_Element S
CD-SEM_Gacii-SE046A
GaAsGaNInPLNLT substrate and epitaxial wafer defect detection equipment_E1000
Stylus Profilometer 2D3D Stylus Measurement Alpha Step_D-600
Optical Profiler_Zeta-20
Defect Scanner_AT1AT2
SiC defect detection equipment_E3500
Nano Indenter_G200X
Thickness Measurement Mapping Instrument_F50
Sheet Resistance Mapping System_R50
